What's Happening?
Thermo Fisher Scientific has developed the Scios 3 FIB-SEM, an advanced automated microscopy system designed to address the skills gap in the manufacturing industry. This system integrates focused ion beam (FIB) and scanning electron microscope (SEM) technologies, offering high-throughput and precise materials analysis. The automation features of the Scios 3 FIB-SEM reduce the learning curve associated with operating complex microscopy equipment, making it accessible to users with limited experience. The system supports various configurations, including secondary ion mass spectrometry (SIMS) and energy dispersive X-ray spectroscopy (EDS), allowing teams to tailor it for specific applications such as failure analysis and quality control.
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Why It's Important?
The introduction of automated microscopy systems like the Scios 3 FIB-SEM is crucial for the manufacturing industry, which faces a significant skills gap. Many quality control and failure analysis teams lack the expertise to operate advanced characterisation equipment, hindering their ability to analyse complex materials. By automating key workflows, the Scios 3 FIB-SEM improves consistency and productivity, even when operated by less experienced users. This technology enables manufacturers to overcome barriers to advanced materials characterisation, supporting the development of high-performance materials essential for industries such as automotive and aerospace.
What's Next?
The adoption of automated microscopy systems is expected to grow as industries seek to bridge the skills gap and enhance their materials analysis capabilities. Manufacturers may increasingly rely on such technologies to improve efficiency and reduce reliance on skilled operators. As the Scios 3 FIB-SEM becomes more widely used, it could lead to advancements in materials development and quality control processes, driving innovation across various sectors.
